With increasing amounts of music being digitally transferred from production to distribution, automatic means of determining media quality are needed. Protection mechanisms in digital audio processing tools have not eliminated the need of production entities located downstream the distribution chain to assess audio quality and detect defects inserted further upstream. Such analysis often relies on the received audio and scarce meta-data alone. Deliberate use of artefacts such as clicks in popular music as well as more recent defects stemming from corruption in modern audio encodings call for data-centric and context sensitive solutions for detection. We present a convolutional network architecture following end-to-end encoder decoder configuration to develop detectors for two exemplary audio defects. A click detector is trained and compared to a traditional signal processing method, with a discussion on context sensitivity. Additional post-processing is used for data augmentation and workflow simulation. The ability of our models to capture variance is explored in a detector for artefacts from decompression of corrupted MP3 compressed audio. For both tasks we describe the synthetic generation of artefacts for controlled detector training and evaluation. We evaluate our detectors on the large open-source Free Music Archive (FMA) and genre-specific datasets.
Additive manufacturing techniques are revolutionizing product development by enabling fast turnaround from design to fabrication. However, the throughput of the rapid prototyping pipeline remains constrained by print optimization, requiring multiple iterations of fabrication and ex-situ metrology. Despite the need for a suitable technology, robust in-situ shape measurement of an entire print is not currently available with any additive manufacturing modality. Here, we address this shortcoming by demonstrating fully simultaneous 3D metrology and printing. We exploit the dramatic increase in light scattering by a photoresin during gelation for real-time 3D imaging of prints during tomographic volumetric additive manufacturing. Tomographic imaging of the light scattering density in the build volume yields quantitative, artifact-free 3D + time models of cured objects that are accurate to below 1% of the size of the print. By integrating shape measurement into the printing process, our work paves the way for next-generation rapid prototyping with real-time defect detection and correction.
The analysis of ultrasonic NDE data has traditionally been addressed by a trained operator manually interpreting data with the support of rudimentary automation tools. Recently, many demonstrations of deep learning (DL) techniques that address individual NDE tasks (data pre-processing, defect detection, defect characterisation, and property measurement) have started to emerge in the research community. These methods have the potential to offer high flexibility, efficiency, and accuracy subject to the availability of sufficient training data. Moreover, they enable the automation of complex processes that span one or more NDE steps (e.g. detection, characterisation, and sizing). There is, however, a lack of consensus on the direction and requirements that these new methods should follow. These elements are critical to help achieve automation of ultrasonic NDE driven by artificial intelligence such that the research community, industry, and regulatory bodies embrace it. This paper reviews the state-of-the-art of autonomous ultrasonic NDE enabled by DL methodologies. The review is organised by the NDE tasks that are addressed by means of DL approaches. Key remaining challenges for each task are noted. Basic axiomatic principles for DL methods in NDE are identified based on the literature review, relevant international regulations, and current industrial needs. By placing DL methods in the context of general NDE automation levels, this paper aims to provide a roadmap for future research and development in the area.
In this paper, we present a Robust Completed Local Binary Pattern (RCLBP) framework for a surface defect detection task. Our approach uses a combination of Non-Local (NL) means filter with wavelet thresholding and Completed Local Binary Pattern (CLBP) to extract robust features which are fed into classifiers for surface defects detection. This paper combines three components: A denoising technique based on Non-Local (NL) means filter with wavelet thresholding is established to denoise the noisy image while preserving the textures and edges. Second, discriminative features are extracted using the CLBP technique. Finally, the discriminative features are fed into the classifiers to build the detection model and evaluate the performance of the proposed framework. The performance of the defect detection models are evaluated using a real-world steel surface defect database from Northeastern University (NEU). Experimental results demonstrate that the proposed approach RCLBP is noise robust and can be applied for surface defect detection under varying conditions of intra-class and inter-class changes and with illumination changes.
Quality control and quality assurance are challenges in Direct Metal Laser Melting (DMLM). Intermittent machine diagnostics and downstream part inspections catch problems after undue cost has been incurred processing defective parts. In this paper we demonstrate two methodologies for in-process fault detection and part quality prediction that can be readily deployed on existing commercial DMLM systems with minimal hardware modification. Novel features were derived from the time series of common photodiode sensors along with standard machine control signals. A Bayesian approach attributes measurements to one of multiple process states and a least squares regression model predicts severity of certain material defects.
A critical aspect in the manufacturing process is the visual quality inspection of manufactured components for defects and flaws. Human-only visual inspection can be very time-consuming and laborious, and is a significant bottleneck especially for high-throughput manufacturing scenarios. Given significant advances in the field of deep learning, automated visual quality inspection can lead to highly efficient and reliable detection of defects and flaws during the manufacturing process. However, deep learning-driven visual inspection methods often necessitate significant computational resources, thus limiting throughput and act as a bottleneck to widespread adoption for enabling smart factories. In this study, we investigated the utilization of a machine-driven design exploration approach to create TinyDefectNet, a highly compact deep convolutional network architecture tailored for high-throughput manufacturing visual quality inspection. TinyDefectNet comprises of just ~427K parameters and has a computational complexity of ~97M FLOPs, yet achieving a detection accuracy of a state-of-the-art architecture for the task of surface defect detection on the NEU defect benchmark dataset. As such, TinyDefectNet can achieve the same level of detection performance at 52$\times$ lower architectural complexity and 11x lower computational complexity. Furthermore, TinyDefectNet was deployed on an AMD EPYC 7R32, and achieved 7.6x faster throughput using the native Tensorflow environment and 9x faster throughput using AMD ZenDNN accelerator library. Finally, explainability-driven performance validation strategy was conducted to ensure correct decision-making behaviour was exhibited by TinyDefectNet to improve trust in its usage by operators and inspectors.
As solar capacity installed worldwide continues to grow, there is an increasing awareness that advanced inspection systems are becoming of utmost importance to schedule smart interventions and minimize downtime likelihood. In this work we propose a novel automatic multi-stage model to detect panel defects on aerial images captured by unmanned aerial vehicle by using the YOLOv3 network and Computer Vision techniques. The model combines detections of panels and defects to refine its accuracy and exhibits an average inference time per image of 0.98 s. The main novelties are represented by its versatility to process either thermographic or visible images and detect a large variety of defects, to prescript recommended actions to O&M crew to give a more efficient data-driven maintenance strategy and its portability to both rooftop and ground-mounted PV systems and different panel types. The proposed model has been validated on two big PV plants in the south of Italy with an outstanding [email omitted] exceeding 98% for panel detection, a remarkable [email omitted] ([email omitted]) of roughly 88.3% (66.9%) for hotspots by means of infrared thermography and a [email omitted] of almost 70% in the visible spectrum for detection of anomalies including panel shading induced by soiling and bird dropping, delamination, presence of puddles and raised rooftop panels. The model predicts also the severity of hotspot areas based on the estimated temperature gradients, as well as it computes the soiling coverage based on visual images. Finally an analysis of the influence of the different YOLOv3's output scales on the detection is discussed.
A method for object classification that is based on distribution analysis is proposed. In addition, a method for finding relevant features and the unification of this algorithm with another classification algorithm is proposed. The presented classification algorithm has been applied successfully to real-world measurement data from wafer fabrication of close to hundred thousand chips of several product types. The presented algorithm prefers finding the best rater in a low-dimensional search space over finding a good rater in a high-dimensional search space. Our approach is interesting in that it is fast (quasi-linear) and reached good to excellent prediction or detection quality for real-world wafer data.
X-ray image plays an important role in manufacturing industry for quality assurance, because it can reflect the internal condition of weld region. However, the shape and scale of different defect types vary greatly, which makes it challenging for model to detect weld defects. In this paper, we propose a weld defect detection method based on convolution neural network, namely Lighter and Faster YOLO (LF-YOLO). In particularly, a reinforced multiscale feature (RMF) module is designed to implement both parameter-based and parameter-free multi-scale information extracting operation. RMF enables the extracted feature map capable to represent more plentiful information, which is achieved by superior hierarchical fusion structure. To improve the performance of detection network, we propose an efficient feature extraction (EFE) module. EFE processes input data with extremely low consumption, and improves the practicability of whole network in actual industry. Experimental results show that our weld defect detection network achieves satisfactory balance between performance and consumption, and reaches 92.9 mean average precision mAP50 with 61.5 frames per second (FPS). To further prove the ability of our method, we test it on public dataset MS COCO, and the results show that our LF-YOLO has a outstanding versatility detection performance. The code is available at https://github.com/lmomoy/LF-YOLO.
Surface defect recognition of products is a necessary process to guarantee the quality of industrial production. This paper proposes a hybrid model, S2D2Net (Steel Surface Defect Diagnosis Network), for an efficient and robust inspection of the steel surface during the manufacturing process. The S2D2Net uses a pretrained ImageNet model as a feature extractor and learns a Capsule Network over the extracted features. The experimental results on a publicly available steel surface defect dataset (NEU) show that S2D2Net achieved 99.17% accuracy with minimal training data and improved by 9.59% over its closest competitor based on GAN. S2D2Net proved its robustness by achieving 94.7% accuracy on a diversity enhanced dataset, ENEU, and improved by 3.6% over its closest competitor. It has better, robust recognition performance compared to other state-of-the-art DNN-based detectors.
In industrial manufacturing processes, errors frequently occur at unpredictable times and in unknown manifestations. We tackle the problem of automatic defect detection without requiring any image samples of defective parts. Recent works model the distribution of defect-free image data, using either strong statistical priors or overly simplified data representations. In contrast, our approach handles fine-grained representations incorporating the global and local image context while flexibly estimating the density. To this end, we propose a novel fully convolutional cross-scale normalizing flow (CS-Flow) that jointly processes multiple feature maps of different scales. Using normalizing flows to assign meaningful likelihoods to input samples allows for efficient defect detection on image-level. Moreover, due to the preserved spatial arrangement the latent space of the normalizing flow is interpretable which enables to localize defective regions in the image. Our work sets a new state-of-the-art in image-level defect detection on the benchmark datasets Magnetic Tile Defects and MVTec AD showing a 100% AUROC on 4 out of 15 classes.
A radical paradigm shift of wireless networks from ``connected things'' to ``connected intelligence'' undergoes, which coincides with the Shanno and Weaver's envisions: Communications will transform from the technical level to the semantic level. This article proposes a semantic communication method with artificial intelligence tasks (SC-AIT). First, the architecture of SC-AIT is elaborated. Then, based on the proposed architecture, we implement SC-AIT for a image classifications task. A prototype of SC-AIT is also established for surface defect detection, is conducted. Experimental results show that SC-AIT has much lower bandwidth requirements, and can achieve more than $40\%$ classification accuracy gains compared with the communications at the technical level. Future trends and key challenges for semantic communications are also identified.
Deep learning methods have proven to outperform traditional computer vision methods in various areas of image processing. However, the application of deep learning in industrial surface defect detection systems is challenging due to the insufficient amount of training data, the expensive data generation process, the small size, and the rare occurrence of surface defects. From literature and a polymer products manufacturing use case, we identify design requirements which reflect the aforementioned challenges. Addressing these, we conceptualize design principles and features informed by deep learning research. Finally, we instantiate and evaluate the gained design knowledge in the form of actionable guidelines and strategies based on an industrial surface defect detection use case. This article, therefore, contributes to academia as well as practice by (1) systematically identifying challenges for the industrial application of deep learning-based surface defect detection, (2) strategies to overcome these, and (3) an experimental case study assessing the strategies' applicability and usefulness.
Some response surface functions in complex engineering systems are usually highly nonlinear, unformed, and expensive-to-evaluate. To tackle this challenge, Bayesian optimization, which conducts sequential design via a posterior distribution over the objective function, is a critical method used to find the global optimum of black-box functions. Kernel functions play an important role in shaping the posterior distribution of the estimated function. The widely used kernel function, e.g., radial basis function (RBF), is very vulnerable and susceptible to outliers; the existence of outliers is causing its Gaussian process surrogate model to be sporadic. In this paper, we propose a robust kernel function, Asymmetric Elastic Net Radial Basis Function (AEN-RBF). Its validity as a kernel function and computational complexity are evaluated. When compared to the baseline RBF kernel, we prove theoretically that AEN-RBF can realize smaller mean squared prediction error under mild conditions. The proposed AEN-RBF kernel function can also realize faster convergence to the global optimum. We also show that the AEN-RBF kernel function is less sensitive to outliers, and hence improves the robustness of the corresponding Bayesian optimization with Gaussian processes. Through extensive evaluations carried out on synthetic and real-world optimization problems, we show that AEN-RBF outperforms existing benchmark kernel functions.
The usage of electronic devices increases, and becomes predominant in most aspects of life. Surface Mount Technology (SMT) is the most common industrial method for manufacturing electric devices in which electrical components are mounted directly onto the surface of a Printed Circuit Board (PCB). Although the expansion of electronic devices affects our lives in a productive way, failures or defects in the manufacturing procedure of those devices might also be counterproductive and even harmful in some cases. It is therefore desired and sometimes crucial to ensure zero-defect quality in electronic devices and their production. While traditional Image Processing (IP) techniques are not sufficient to produce a complete solution, other promising methods like Deep Learning (DL) might also be challenging for PCB inspection, mainly because such methods require big adequate datasets which are missing, not available or not updated in the rapidly growing field of PCBs. Thus, PCB inspection is conventionally performed manually by human experts. Unsupervised Learning (UL) methods may potentially be suitable for PCB inspection, having learning capabilities on the one hand, while not relying on large datasets on the other. In this paper, we introduce ChangeChip, an automated and integrated change detection system for defect detection in PCBs, from soldering defects to missing or misaligned electronic elements, based on Computer Vision (CV) and UL. We achieve good quality defect detection by applying an unsupervised change detection between images of a golden PCB (reference) and the inspected PCB under various setting. In this work, we also present CD-PCB, a synthesized labeled dataset of 20 pairs of PCB images for evaluation of defect detection algorithms.
With the rapid development of intelligent detection algorithms based on deep learning, much progress has been made in automatic road defect recognition and road marking parsing. This can effectively address the issue of an expensive and time-consuming process for professional inspectors to review the street manually. Towards this goal, we present RoadAtlas, a novel end-to-end integrated system that can support 1) road defect detection, 2) road marking parsing, 3) a web-based dashboard for presenting and inputting data by users, and 4) a backend containing a well-structured database and developed APIs.
Pre-trained models for Natural Languages (NL) like BERT and GPT have been recently shown to transfer well to Programming Languages (PL) and largely benefit a broad set of code-related tasks. Despite their success, most current methods either rely on an encoder-only (or decoder-only) pre-training that is suboptimal for generation (resp. understanding) tasks or process the code snippet in the same way as NL, neglecting the special characteristics of PL such as token types. We present CodeT5, a unified pre-trained encoder-decoder Transformer model that better leverages the code semantics conveyed from the developer-assigned identifiers. Our model employs a unified framework to seamlessly support both code understanding and generation tasks and allows for multi-task learning. Besides, we propose a novel identifier-aware pre-training task that enables the model to distinguish which code tokens are identifiers and to recover them when they are masked. Furthermore, we propose to exploit the user-written code comments with a bimodal dual generation task for better NL-PL alignment. Comprehensive experiments show that CodeT5 significantly outperforms prior methods on understanding tasks such as code defect detection and clone detection, and generation tasks across various directions including PL-NL, NL-PL, and PL-PL. Further analysis reveals that our model can better capture semantic information from code. Our code and pre-trained models are released at https: //github.com/salesforce/CodeT5 .
In this paper, we propose an efficient approach for industrial defect detection that is modeled based on anomaly detection using point pattern data. Most recent works use \textit{global features} for feature extraction to summarize image content. However, global features are not robust against lighting and viewpoint changes and do not describe the image's geometrical information to be fully utilized in the manufacturing industry. To the best of our knowledge, we are the first to propose using transfer learning of local/point pattern features to overcome these limitations and capture geometrical information of the image regions. We model these local/point pattern features as a random finite set (RFS). In addition we propose RFS energy, in contrast to RFS likelihood as anomaly score. The similarity distribution of point pattern features of the normal sample has been modeled as a multivariate Gaussian. Parameters learning of the proposed RFS energy does not require any heavy computation. We evaluate the proposed approach on the MVTec AD dataset, a multi-object defect detection dataset. Experimental results show the outstanding performance of our proposed approach compared to the state-of-the-art methods, and the proposed RFS energy outperforms the state-of-the-art in the few shot learning settings.
A generic fast method for object classification is proposed. In addition, a method for dimensional reduction is presented. The presented algorithms have been applied to real-world data from chip fabrication successfully to the task of predicting defect states of tens of thousands of chips of several products based on measurements or even just part of measurements. Unlike typical neural networks with a large number of weights to optimize over, the presented algorithm tries optimizing only over a very small number of variables in order to increase chances to find a global optimum. Our approach is interesting in that it is fast, led to good to very good performance with real-world wafer data, allows for short implementations and computes values which have a clear meaning easy to explain.
Electron microscopy is widely used to explore defects in crystal structures, but human detecting of defects is often time-consuming, error-prone, and unreliable, and is not scalable to large numbers of images or real-time analysis. In this work, we discuss the application of machine learning approaches to find the location and geometry of different defect clusters in irradiated steels. We show that a deep learning based Faster R-CNN analysis system has a performance comparable to human analysis with relatively small training data sets. This study proves the promising ability to apply deep learning to assist the development of automated microscopy data analysis even when multiple features are present and paves the way for fast, scalable, and reliable analysis systems for massive amounts of modern electron microscopy data.