LF-YOLO: A Lighter and Faster YOLO for Weld Defect Detection of X-ray Image
원문 초록
X-ray image plays an important role in manufacturing industry for quality assurance, because it can reflect the internal condition of weld region. However, the shape and scale of different defect types vary greatly, which makes it challenging for model to detect weld defects. In this paper, we propose a weld defect detection method based on convolution neural network, namely Lighter and Faster YOLO (LF-YOLO). In particularly, a reinforced multiscale feature (RMF) module is designed to implement both parameter-based and parameter-free multi-scale information extracting operation. RMF enables the extracted feature map capable to represent more plentiful information, which is achieved by superior hierarchical fusion structure. To improve the performance of detection network, we propose an efficient feature extraction (EFE) module. EFE processes input data with extremely low consumption, and improves the practicability of whole network in actual industry. Experimental results show that our weld defect detection network achieves satisfactory balance between performance and consumption, and reaches 92.9 mean average precision mAP50 with 61.5 frames per second (FPS). To further prove the ability of our method, we test it on public dataset MS COCO, and the results show that our LF-YOLO has a outstanding versatility detection performance. The code is available at https://github.com/lmomoy/LF-YOLO.
함께 살펴볼 논문
공통 태그를 근거로 연결했습니다. 실제 인용 관계나 논문의 우수성을 뜻하지 않습니다.
Semi-Supervised Defect Detection via Conditional Diffusion and CLIP-Guided Noise Filtering
How Good Are Synthetic Requirements ? Evaluating LLM-Generated Datasets for AI4RE
SteelBlastQC: Shot-blasted Steel Surface Dataset with Interpretable Detection of Surface Defects
Crane: Context-Guided Prompt Learning and Attention Refinement for Zero-Shot Anomaly Detections
ZS-VCOS: Zero-Shot Outperforms Supervised Video Camouflaged Object Segmentation
Predicting Performance of Object Detection Models in Electron Microscopy Using Random Forests
토론
이 논문과 연결된 포럼 글이 아직 없습니다.