Physics-Informed Sinusoidal Representation Networks for Damage Identification in Ultrasonic Guided Wave Structural Health Monitoring

원문 초록

Ultrasonic guided wave (UGW) inspection has become an effective method in structural health monitoring (SHM). While machine learning has enhanced damage detection capabilities, purely data-driven models remain constrained by extensive labeled datasets and limited physical interpretability. Standard multi-layer perceptrons (MLPs) further suffer from spectral bias (F-Principle) in high-frequency regimes, prioritizing low-frequency components while failing to resolve the high-frequency oscillations critical for UGW reconstruction. Physics-Informed Sinusoidal Representation Networks (PI-SIRENs) address these limitations by embedding governing partial differential equations directly into the training process. Building upon SIRENs, which utilize periodic activation functions to inherently capture high-frequency spectral content, the proposed framework is designed to operate effectively in sparse ultrasonic measurement regimes. This work introduces a frequency-domain PI-SIREN framework tailored for the Mindlin-Reissner plate theory to reconstruct ultrasonic wavefields without temporal discretization. The model parameters are optimized using a hybrid strategy comprising three phases: first-order Adam, residual-adaptive refinement (RAR) and quasi-Newton L-BFGS. Numerical and experimental evaluations confirm that the model serves as a physics-consistent baseline derived from sparse data, functioning as a computationally efficient surrogate for damage identification in SHM and non-destructive testing (NDT). Integrating the surrogate into a damage identification pipeline detects and localizes a milled notch from sparse experimental measurements with a localization error of 1 % of the plate diagonal. In contrast, data-driven benchmarks and MLPs with hyperbolic tangent activation functions, with and without Fourier feature embedding, are unable to identify damage due to higher reconstruction errors.