Out-of-Distribution Data: An Acquaintance of Adversarial Examples -- A Survey
원문 초록
Deep neural networks (DNNs) deployed in real-world applications can encounter out-of-distribution (OOD) data and adversarial examples. These represent distinct forms of distributional shifts that can significantly impact DNNs' reliability and robustness. Traditionally, research has addressed OOD detection and adversarial robustness as separate challenges. This survey focuses on the intersection of these two areas, examining how the research community has investigated them together. Consequently, we identify two key research directions: robust OOD detection and unified robustness. Robust OOD detection aims to differentiate between in-distribution (ID) data and OOD data, even when they are adversarially manipulated to deceive the OOD detector. Unified robustness seeks a single approach to make DNNs robust against both adversarial attacks and OOD inputs. Accordingly, first, we establish a taxonomy based on the concept of distributional shifts. This framework clarifies how robust OOD detection and unified robustness relate to other research areas addressing distributional shifts, such as OOD detection, open set recognition, and anomaly detection. Subsequently, we review existing work on robust OOD detection and unified robustness. Finally, we highlight the limitations of the existing work and propose promising research directions that explore adversarial and OOD inputs within a unified framework.
함께 살펴볼 논문
공통 태그를 근거로 연결했습니다. 실제 인용 관계나 논문의 우수성을 뜻하지 않습니다.
PatchGuard: Adversarially Robust Anomaly Detection and Localization through Vision Transformers and Pseudo Anomalies
Structure-based Anomaly Detection and Clustering
Quantum Support Vector Regression for Robust Anomaly Detection
RAID: A Dataset for Testing the Adversarial Robustness of AI-Generated Image Detectors
Bridging Robustness and Generalization Against Word Substitution Attacks in NLP via the Growth Bound Matrix Approach
Towards High-Resolution 3D Anomaly Detection: A Scalable Dataset and Real-Time Framework for Subtle Industrial Defects
토론
이 논문과 연결된 포럼 글이 아직 없습니다.