Improving Few-shot Learning with Weakly-supervised Object Localization
원문 초록
Few-shot learning often involves metric learning-based classifiers, which predict the image label by comparing the distance between the extracted feature vector and class representations. However, applying global pooling in the backend of the feature extractor may not produce an embedding that correctly focuses on the class object. In this work, we propose a novel framework that generates class representations by extracting features from class-relevant regions of the images. Given only a few exemplary images with image-level labels, our framework first localizes the class objects by spatially decomposing the similarity between the images and their class prototypes. Then, enhanced class representations are achieved from the localization results. We also propose a loss function to enhance distinctions of the refined features. Our method outperforms the baseline few-shot model in miniImageNet and tieredImageNet benchmarks.
함께 살펴볼 논문
공통 태그를 근거로 연결했습니다. 실제 인용 관계나 논문의 우수성을 뜻하지 않습니다.
Texture or Semantics? Vision-Language Models Get Lost in Font Recognition
PixelCAM: Pixel Class Activation Mapping for Histology Image Classification and ROI Localization
TeD-Loc: Text Distillation for Weakly Supervised Object Localization
Few-Shot Learning for Industrial Time Series: A Comparative Analysis Using the Example of Screw-Fastening Process Monitoring
Pro2SAM: Mask Prompt to SAM with Grid Points for Weakly Supervised Object Localization
ProFi-Net: Prototype-based Feature Attention with Curriculum Augmentation for WiFi-based Gesture Recognition
토론
이 논문과 연결된 포럼 글이 아직 없습니다.