In the domain of rotating machinery, bearings are vulnerable to different mechanical faults, including ball, inner, and outer race faults. Various techniques can be used in condition-based monitoring, from classical signal analysis to deep learning methods. Based on the complex working conditions of rotary machines, multivariate statistical process control charts such as Hotelling's $T^2$ and Squared Prediction Error are useful for providing early warnings. However, these methods are rarely applied to condition monitoring of rotating machinery due to the univariate nature of the datasets. In the present paper, we propose a multivariate statistical process control-based fault detection method that utilizes multivariate data composed of Fourier transform features extracted for fixed-time batches. Our approach makes use of the multidimensional nature of Fourier transform characteristics, which record more detailed information about the machine's status, in an effort to enhance early defect detection and diagnosis. Experiments with varying vibration measurement locations (Fan End, Drive End), fault types (ball, inner, and outer race faults), and motor loads (0-3 horsepower) are used to validate the suggested approach. The outcomes illustrate our method's effectiveness in fault detection and point to possible broader uses in industrial maintenance.
With the rapid growth of the PCB manufacturing industry, there is an increasing demand for computer vision inspection to detect defects during production. Improving the accuracy and generalization of PCB defect detection models remains a significant challenge. This paper proposes a high-precision, robust, and real-time end-to-end method for PCB defect detection based on deep Convolutional Neural Networks (CNN). Traditional methods often suffer from low accuracy and limited applicability. We propose a novel approach combining YOLOv5 and multiscale modules for hierarchical residual-like connections. In PCB defect detection, noise can confuse the background and small targets. The YOLOv5 model provides a strong foundation with its real-time processing and accurate object detection capabilities. The multi-scale module extends traditional approaches by incorporating hierarchical residual-like connections within a single block, enabling multiscale feature extraction. This plug-and-play module significantly enhances performance by extracting features at multiple scales and levels, which are useful for identifying defects of varying sizes and complexities. Our multi-scale architecture integrates feature extraction, defect localization, and classification into a unified network. Experiments on a large-scale PCB dataset demonstrate significant improvements in precision, recall, and F1-score compared to existing methods. This work advances computer vision inspection for PCB defect detection, providing a reliable solution for high-precision, robust, real-time, and domain-adaptive defect detection in the PCB manufacturing industry.
Efficient and intelligent surface defect detection of photovoltaic modules is crucial for improving the quality of photovoltaic modules and ensuring the reliable operation of large-scale infrastructure. However, the scenario characteristics of data distribution deviation make the construction of defect detection models for open world scenarios such as photovoltaic manufacturing and power plant inspections a challenge. Therefore, we propose the Gather and Distribute Domain shift Suppression Network (GDDS). It adopts a single domain generalized method that is completely independent of the test samples to address the problem of distribution shift. Using a one-stage network as the baseline network breaks through the limitations of traditional domain generalization methods that typically use two-stage networks. It not only balances detection accuracy and speed but also simplifies the model deployment and application process. The GDDS includes two modules: DeepSpine Module and Gather and Distribute Module. Specifically, the DeepSpine Module applies a wider range of contextual information and suppresses background style shift by acquiring and concatenating multi-scale features. The Gather and Distribute Module collects and distributes global information to achieve cross layer interactive learning of multi-scale channel features and suppress defect instance shift. Furthermore, the GDDS utilizes normalized Wasserstein distance for similarity measurement, reducing measurement errors caused by bounding box position deviations. We conducted a comprehensive evaluation of GDDS on the EL endogenous shift dataset and Photovoltaic inspection infrared image dataset. The experimental results showed that GDDS can adapt to defect detection in open world scenarios faster and better than other state-of-the-art methods.
Laser powder bed fusion (LPBF) process can incur defects due to melt pool instabilities, spattering, temperature increase, and powder spread anomalies. Identifying defects through in-situ monitoring typically requires collecting, storing, and analyzing large amounts of data generated. The first goal of this work is to propose a new approach to accurately map in-situ data to a three-dimensional (3D) geometry, aiming to reduce the amount of storage. The second goal of this work is to introduce several new IR features for defect detection or process model calibration, which include laser scan order, local preheat temperature, maximum pre-laser scanning temperature, and number of spatters generated locally and their landing locations. For completeness, processing of other common IR features, such as interpass temperature, heat intensity, cooling rates, and melt pool area, are also presented with the underlying algorithm and Python implementation. A number of different parts are printed, monitored, and characterized to provide evidence of process defects and anomalies that different IR features are capable of detecting.
Intelligence is key to advancing integrated circuit (IC) fabrication. Recent breakthroughs in Large Multimodal Models (LMMs) have unlocked extraditionary abilities in understanding images and text, fostering intelligent fabrication. Leveraging the power of LMMs, we introduce FabGPT, a customized IC fabrication large multimodal model for wafer defect knowledge query. FabGPT manifests expertise in conducting defect detection in Scanning Electron Microscope (SEM) images, performing root cause analysis, and providing expert Q&A on fabrication processes. FabGPT matches enhanced multimodal features to automatically detect minute defects under complex wafer backgrounds and reduce the subjectivity of manual threshold settings. Besides, the proposed modulation module and interactive corpus training strategy embed wafer defect knowledge into the pre-trained model, effectively balancing Q&A queries related to defect knowledge and original knowledge and mitigating the modality bias issues. Experiments on in-house fab data show that FabGPT achieves significant performance improvement in wafer defect detection and knowledge querying.
Anomaly synthesis strategies can effectively enhance unsupervised anomaly detection. However, existing strategies have limitations in the coverage and controllability of anomaly synthesis, particularly for weak defects that are very similar to normal regions. In this paper, we propose Global and Local Anomaly co-Synthesis Strategy (GLASS), a novel unified framework designed to synthesize a broader coverage of anomalies under the manifold and hypersphere distribution constraints of Global Anomaly Synthesis (GAS) at the feature level and Local Anomaly Synthesis (LAS) at the image level. Our method synthesizes near-in-distribution anomalies in a controllable way using Gaussian noise guided by gradient ascent and truncated projection. GLASS achieves state-of-the-art results on the MVTec AD (detection AUROC of 99.9\%), VisA, and MPDD datasets and excels in weak defect detection. The effectiveness and efficiency have been further validated in industrial applications for woven fabric defect detection. The code and dataset are available at: \url{https://github.com/cqylunlun/GLASS}.
Machine Learning (ML) models integrated with in-situ sensing offer transformative solutions for defect detection in Additive Manufacturing (AM), but this integration brings critical challenges in safeguarding sensitive data, such as part designs and material compositions. Differential Privacy (DP), which introduces mathematically controlled noise, provides a balance between data utility and privacy. However, black-box Artificial Intelligence (AI) models often obscure how this noise impacts model accuracy, complicating the optimization of privacy-accuracy trade-offs. This study introduces the Differential Privacy-Hyperdimensional Computing (DP-HD) framework, a novel approach combining Explainable AI (XAI) and vector symbolic paradigms to quantify and predict noise effects on accuracy using a Signal-to-Noise Ratio (SNR) metric. DP-HD enables precise tuning of DP noise levels, ensuring an optimal balance between privacy and performance. The framework has been validated using real-world AM data, demonstrating its applicability to industrial environments. Experimental results demonstrate DP-HD's capability to achieve state-of-the-art accuracy (94.43%) with robust privacy protections in anomaly detection for AM, even under significant noise conditions. Beyond AM, DP-HD holds substantial promise for broader applications in privacy-sensitive domains such as healthcare, financial services, and government data management, where securing sensitive data while maintaining high ML performance is paramount.
Defect detection is the task of identifying defects in production samples. Usually, defect detection classifiers are trained on ground-truth data formed by normal samples (negative data) and samples with defects (positive data), where the latter are consistently fewer than normal samples. State-of-the-art data augmentation procedures add synthetic defect data by superimposing artifacts to normal samples to mitigate problems related to unbalanced training data. These techniques often produce out-of-distribution images, resulting in systems that learn what is not a normal sample but cannot accurately identify what a defect looks like. In this work, we introduce DIAG, a training-free Diffusion-based In-distribution Anomaly Generation pipeline for data augmentation. Unlike conventional image generation techniques, we implement a human-in-the-loop pipeline, where domain experts provide multimodal guidance to the model through text descriptions and region localization of the possible anomalies. This strategic shift enhances the interpretability of results and fosters a more robust human feedback loop, facilitating iterative improvements of the generated outputs. Remarkably, our approach operates in a zero-shot manner, avoiding time-consuming fine-tuning procedures while achieving superior performance. We demonstrate the efficacy and versatility of DIAG with respect to state-of-the-art data augmentation approaches on the challenging KSDD2 dataset, with an improvement in AP of approximately 18% when positive samples are available and 28% when they are missing. The source code is available at https://github.com/intelligolabs/DIAG.
With the rapid advances in deep learning and smart manufacturing in Industry 4.0, there is an imperative for high-throughput, high-performance, and fully integrated visual inspection systems. Most anomaly detection approaches using defect detection datasets, such as MVTec AD, employ one-class models that require fitting separate models for each class. On the contrary, unified models eliminate the need for fitting separate models for each class and significantly reduce cost and memory requirements. Thus, in this work, we experiment with considering a unified multi-class setup. Our experimental study shows that multi-class models perform at par with one-class models for the standard MVTec AD dataset. Hence, this indicates that there may not be a need to learn separate object/class-wise models when the object classes are significantly different from each other, as is the case of the dataset considered. Furthermore, we have deployed three different unified lightweight architectures on the CPU and an edge device (NVIDIA Jetson Xavier NX). We analyze the quantized multi-class anomaly detection models in terms of latency and memory requirements for deployment on the edge device while comparing quantization-aware training (QAT) and post-training quantization (PTQ) for performance at different precision widths. In addition, we explored two different methods of calibration required in post-training scenarios and show that one of them performs notably better, highlighting its importance for unsupervised tasks. Due to quantization, the performance drop in PTQ is further compensated by QAT, which yields at par performance with the original 32-bit Floating point in two of the models considered.
Insulator defect detection is of great significance to ensure the normal operation of power transmission and distribution networks. In response to the problems of low speed, low accuracy, and difficulty in deploying to embedded terminals in existing insulator defect detection, this paper proposes a lightweight insulator defect detection model based on an improved YOLOv5s, named LiteYOLO-ID. Firstly, to significantly reduce the model parameters while maintaining detection accuracy, we design a new lightweight convolution module called EGC (ECA-GhostNet-C2f). Secondly, based on the EGC module, we construct the EGC-CSPGhostNet backbone network, which optimizes the feature extraction process and achieves model compression. Additionally, we design a lightweight neck network, EGC-PANet, to further reduce the parameter count and achieve efficient feature fusion. Experimental results show that on the IDID-Plus dataset, compared to the original YOLOv5s model, not only does LiteYOLO-ID reduce the model parameters by 47.13\%, but it also improves the mAP(0.5) by 1\%. Furthermore, the generalization of the model is validated on the Pascal VOC dataset and the SFID dataset. Importantly, after TensorRT optimization, the inference speed of the LiteYOLO-ID algorithm on the Jetson TX2 NX reaches 20.2 FPS, meeting the real-time detection requirements of insulator defects. Our code, weight models, and datasets can be obtained at the following URL: https://github.com/LuYang-2023/Insulator-defect-detection.
Fibre ropes with the latest technology have emerged as an appealing alternative to steel ropes for offshore industries due to their lightweight and high tensile strength. At the same time, frequent inspection of these ropes is essential to ensure the proper functioning and safety of the entire system. The development of deep learning (DL) models in condition monitoring (CM) applications offers a simpler and more effective approach for defect detection in synthetic fibre ropes (SFRs). The present paper investigates the performance of Detectron2, a state-of-the-art library for defect detection and instance segmentation. Detectron2 with Mask R-CNN architecture is used for segmenting defects in SFRs. Mask R-CNN with various backbone configurations has been trained and tested on an experimentally obtained dataset comprising 1,803 high-dimensional images containing seven damage classes (placking high, placking medium, placking low, compression, core out, chafing, and normal respectively) for SFRs. By leveraging the capabilities of Detectron2, this study aims to develop an automated and efficient method for detecting defects in SFRs, enhancing the inspection process, and ensuring the safety of the fibre ropes.
In many manufacturing settings, annotating data for machine learning and computer vision is costly, but synthetic data can be generated at significantly lower cost. Substituting the real-world data with synthetic data is therefore appealing for many machine learning applications that require large amounts of training data. However, relying solely on synthetic data is frequently inadequate for effectively training models that perform well on real-world data, primarily due to domain shifts between the synthetic and real-world data. We discuss approaches for dealing with such a domain shift when detecting defects in X-ray scans of aluminium wheels. Using both simulated and real-world X-ray images, we train an object detection model with different strategies to identify the training approach that generates the best detection results while minimising the demand for annotated real-world training samples. Our preliminary findings suggest that the sim-2-real domain adaptation approach is more cost-efficient than a fully supervised oracle - if the total number of available annotated samples is fixed. Given a certain number of labeled real-world samples, training on a mix of synthetic and unlabeled real-world data achieved comparable or even better detection results at significantly lower cost. We argue that future research into the cost-efficiency of different training strategies is important for a better understanding of how to allocate budget in applied machine learning projects.
Deep learning has been constantly improving in recent years and a significant number of researchers have devoted themselves to the research of defect detection algorithms. Detection and recognition of small and complex targets is still a problem that needs to be solved. The authors of this research would like to present an improved defect detection model for detecting small and complex defect targets in steel surfaces. During steel strip production mechanical forces and environmental factors cause surface defects of the steel strip. Therefore the detection of such defects is key to the production of high-quality products. Moreover surface defects of the steel strip cause great economic losses to the high-tech industry. So far few studies have explored methods of identifying the defects and most of the currently available algorithms are not sufficiently effective. Therefore this study presents an improved real-time metallic surface defect detection model based on You Only Look Once (YOLOv5) specially designed for small networks. For the smaller features of the target the conventional part is replaced with a depth-wise convolution and channel shuffle mechanism. Then assigning weights to Feature Pyramid Networks (FPN) output features and fusing them increases feature propagation and the networks characterization ability. The experimental results reveal that the improved proposed model outperforms other comparable models in terms of accuracy and detection time. The precision of the proposed model achieved by @mAP is 77.5% on the Northeastern University Dataset NEU-DET and 70.18% on the GC10-DET datasets
Recent advancements in quality control across various industries have increasingly utilized the integration of video cameras and image processing for effective defect detection. A critical barrier to progress is the scarcity of comprehensive datasets featuring annotated defects, which are essential for developing and refining automated defect detection models. This systematic review, spanning from 2015 to 2023, identifies 15 publicly available datasets and critically examines them to assess their effectiveness and applicability for benchmarking and model development. Our findings reveal a diverse landscape of datasets, such as NEU-CLS, NEU-DET, DAGM, KolektorSDD, PCB Defect Dataset, and the Hollow Cylindrical Defect Detection Dataset, each with unique strengths and limitations in terms of image quality, defect type representation, and real-world applicability. The goal of this systematic review is to consolidate these datasets in a single location, providing researchers who seek such publicly available resources with a comprehensive reference.
Material defects (MD) represent a primary challenge affecting product performance and giving rise to safety issues in related products. The rapid and accurate identification and localization of MD constitute crucial research endeavors in addressing contemporary challenges associated with MD. In recent years, propelled by the swift advancement of machine learning (ML) technologies, particularly exemplified by deep learning, ML has swiftly emerged as the core technology and a prominent research direction for material defect detection (MDD). Through a comprehensive review of the latest literature, we systematically survey the ML techniques applied in MDD into five categories: unsupervised learning, supervised learning, semi-supervised learning, reinforcement learning, and generative learning. We provide a detailed analysis of the main principles and techniques used, together with the advantages and potential challenges associated with these techniques. Furthermore, the survey focuses on the techniques for defect detection in composite materials, which are important types of materials enjoying increasingly wide application in various industries such as aerospace, automotive, construction, and renewable energy. Finally, the survey explores potential future directions in MDD utilizing ML technologies. This survey consolidates ML-based MDD literature and provides a foundation for future research and practice.
Tree defect detection is crucial for the structural health screening of trees. Existing nondestructive testing (NDT) techniques for tree defect detection require time-consuming and labor-intensive measurement campaigns. This discourages their application for the routine structural health screening of whole populations of managed urban trees. To address this issue, this study proposes a deep-learning augmented stand-off radar scheme for contactless scanning of tree trunks and rapid detection of tree defects. In this scheme, the antenna is moved along a straight trajectory at a distance from the tree trunk to obtain the trunk's B-scan. The obtained raw B-scan is then processed by a signal-processing framework specifically developed for revealing the scattering signatures of defects in B-scan, which achieves a 30 dB and 22 dB increase in the signal-to-clutter and noise ratio of the measurement data of tree trunk samples and living trees, respectively. Finally, the processed B-scan is input into a multilevel feature fusion neural network particularly designed for extracting the signature of the defect in the processed B-scan in real time. The developed scheme's applications to the detection of defects in real fresh-cut tree trunks show that the stand-off radar scheme can detect tree defects with 96% accuracy. This stand-off radar scheme is the first contactless NDT technique for tree defect detection while operated on a straight trajectory and potentially can be integrated into the routine tree inspection workflow which is part of urban tree management.
Texture surface anomaly detection finds widespread applications in industrial settings. However, existing methods often necessitate gathering numerous samples for model training. Moreover, they predominantly operate within a close-set detection framework, limiting their ability to identify anomalies beyond the training dataset. To tackle these challenges, this paper introduces a novel zero-shot texture anomaly detection method named Global-Regularized Neighborhood Regression (GRNR). Unlike conventional approaches, GRNR can detect anomalies on arbitrary textured surfaces without any training data or cost. Drawing from human visual cognition, GRNR derives two intrinsic prior supports directly from the test texture image: local neighborhood priors characterized by coherent similarities and global normality priors featuring typical normal patterns. The fundamental principle of GRNR involves utilizing the two extracted intrinsic support priors for self-reconstructive regression of the query sample. This process employs the transformation facilitated by local neighbor support while being regularized by global normality support, aiming to not only achieve visually consistent reconstruction results but also preserve normality properties. We validate the effectiveness of GRNR across various industrial scenarios using eight benchmark datasets, demonstrating its superior detection performance without the need for training data. Remarkably, our method is applicable for open-set texture defect detection and can even surpass existing vanilla approaches that require extensive training.
Visual anomaly detection is vital in real-world applications, such as industrial defect detection and medical diagnosis. However, most existing methods focus on local structural anomalies and fail to detect higher-level functional anomalies under logical conditions. Although recent studies have explored logical anomaly detection, they can only address simple anomalies like missing or addition and show poor generalizability due to being heavily data-driven. To fill this gap, we propose SAM-LAD, a zero-shot, plug-and-play framework for logical anomaly detection in any scene. First, we obtain a query image's feature map using a pre-trained backbone. Simultaneously, we retrieve the reference images and their corresponding feature maps via the nearest neighbor search of the query image. Then, we introduce the Segment Anything Model (SAM) to obtain object masks of the query and reference images. Each object mask is multiplied with the entire image's feature map to obtain object feature maps. Next, an Object Matching Model (OMM) is proposed to match objects in the query and reference images. To facilitate object matching, we further propose a Dynamic Channel Graph Attention (DCGA) module, treating each object as a keypoint and converting its feature maps into feature vectors. Finally, based on the object matching relations, an Anomaly Measurement Model (AMM) is proposed to detect objects with logical anomalies. Structural anomalies in the objects can also be detected. We validate our proposed SAM-LAD using various benchmarks, including industrial datasets (MVTec Loco AD, MVTec AD), and the logical dataset (DigitAnatomy). Extensive experimental results demonstrate that SAM-LAD outperforms existing SoTA methods, particularly in detecting logical anomalies.
In this study, we show that diffusion models can be used in industrial scenarios to improve the data augmentation procedure in the context of surface defect detection. In general, defect detection classifiers are trained on ground-truth data formed by normal samples (negative data) and samples with defects (positive data), where the latter are consistently fewer than normal samples. For these reasons, state-of-the-art data augmentation procedures add synthetic defect data by superimposing artifacts to normal samples. This leads to out-of-distribution augmented data so that the classification system learns what is not a normal sample but does not know what a defect really is. We show that diffusion models overcome this situation, providing more realistic in-distribution defects so that the model can learn the defect's genuine appearance. We propose a novel approach for data augmentation that mixes out-of-distribution with in-distribution samples, which we call In&Out. The approach can deal with two data augmentation setups: i) when no defects are available (zero-shot data augmentation) and ii) when defects are available, which can be in a small number (few-shot) or a large one (full-shot). We focus the experimental part on the most challenging benchmark in the state-of-the-art, i.e., the Kolektor Surface-Defect Dataset 2, defining the new state-of-the-art classification AP score under weak supervision of .782. The code is available at https://github.com/intelligolabs/in_and_out.
The automated surface defect detection is a fundamental task in industrial production, and the existing saliencybased works overcome the challenging scenes and give promising detection results. However, the cutting-edge efforts often suffer from large parameter size, heavy computational cost, and slow inference speed, which heavily limits the practical applications. To this end, we devise a multi-scale interactive (MI) module, which employs depthwise convolution (DWConv) and pointwise convolution (PWConv) to independently extract and interactively fuse features of different scales, respectively. Particularly, the MI module can provide satisfactory characterization for defect regions with fewer parameters. Embarking on this module, we propose a lightweight Multi-scale Interactive Network (MINet) to conduct real-time salient object detection of strip steel surface defects. Comprehensive experimental results on SD-Saliency-900 dataset, which contains three kinds of strip steel surface defect detection images (i.e., inclusion, patches, and scratches), demonstrate that the proposed MINet presents comparable detection accuracy with the state-of-the-art methods while running at a GPU speed of 721FPS and a CPU speed of 6.3FPS for 368*368 images with only 0.28M parameters. The code is available at https://github.com/Kunye-Shen/MINet.